Focused Ion-Beam-based Micro and Nanofabrication
Since 2005, the Applied Sensors Laboratory has operated the Focused Ion Beam Center (FIB2 Center) at Georgia Tech, which is associated with the Center for Nanoscale Fabrication and Characterization. The Center is located in the Institute for Paper Science and Technology (IPST) building.
Ongoing Projects:
- Fabrication of AFM probes with tip-integrated frame micro and nanoelectrodes
- AFM-SECM probes with integrated nanodisk electrodes
- Grating couplers for planar single-mode mid-infrared waveguides
